WALOT – Wafer Level Optical Tester – Ecosystem for Micro-Optics
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WALOT – Wafer Level Optical Tester

  • Offering type
    ?
    PRODUCT:

    Component or system, which is commercialized. It is available for ordering multiple pieces and liability is assumed by the provider/seller. Necessary certification of the product was obtained (e.g. CE certification). The product sheet and/or conditions of use are defined.

    PROTOTYPE:

    Component or system, which has been successfully tested under real or real-like conditions. The prototype is not commercialized as the main purpose is to use it for demonstration and experimentation, including user and market acceptance.

    TECHNICAL SERVICE:

    Tools and processes and its combination, which are necessary to prepare and test prototypes or products.
    • Metrology & Quality Control
    • Equipment
  • Market
    • All
  • Manufacturing Pillar
    • Wafer-scale
  • Technology
    • Electrical testing
    • Optical inspection
    • Other

Alfamation’s Wafer Level Optical Tester (WALOT) is a modular test platform allowing optical functional testing on wafers.

TEST APPLICATIONS:

  • Conoscopy: testing beam steering and diffuser optical elements:  Diffractive Optical Elements (DOE) and Meta Optical Elements (MOE).
  • Collimator testing: to verify performances of collimating micro-optics.
  • Automotive projector MLA: testing light projection from MLA for automative lighting
  • Coupling Optics: testing micro-optics for light coupling in telecom and datacom application

 

  • Custom application: highly flexible platform, allowing integration of various test methods, including mixed optical and electrical probing.

Offering Description

KEY FEATURES:

  • Designed to measure devices at wafer level (both single wafers and stacked wafers up to 8 inches) and singulated units with custom designed trays
  • High level of automation for mass production functional testing and R&D
  • Multiple test applications coexistence and convertible with system retooling
  • Automatic calibration sequence with little to no support from the operator
  • User programmable test sequence allows also third party libraries integration
  • Optional wafer warpage compensation with tip-tilt motion system
  • Integrated Barcode and OCR reading
  • SECS/GEM and MES factory interface integration
  • Optimized size: 1250 x 1150 x 1100 mm (w x d x h)

(PDF) WALOT Brochure

(PDF) WALOT Platform Focus

Offering Specifications

WALOT Wafer LEvel Test Platform

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WALOT – Wafer Level Optical Tester

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